C11492: A novel software for imaging analysis of Individual carbon nanotubesNovelty:
Less computing intensive software with novel algorithms that can identify and size individual carbon nanotubes in atomic force microscopy imaging.
Value Proposition:
Johns Hopkins researchers have created a novel data processing and analysis software for atomic force microscopy (AFM). AFM is commonly used to characterize carbon nanotubes (CNTs), but its current capability is limited to measuring gross topographical features. This invention contains novel algorithms that can locate and measure individual CNTs. Its other advantages include:
• Light-weight source code for efficient and wide-range customization
• A user-friendly interface
Technical Details:
Atomic force microscopy (AFM) is a form of scanning probe microscopy (SPM), commonly used to characterize carbon nanotubes(CNTs). Typically, software is employed to analyze large volumes of data in AFM images. This invention uses novel algorithms that can efficiently and accurately analyze the characterization of CNTs. The base-code of the invention is small, allowing a wide-range customization. All algorithms implemented are specific to linear objects. Any conglomerate of linear objects on a flat background may be analyzed with the invention as long as certain factors such as the density of the objects in the field of view and the contrast between the objects and the background are within given limits.
Looking for Partners:
To develop & commercialize the technology as an application for AFM imaging
Stage of Development:
Discovery
Data Availability:
Under NDA/CDA
Publications/Associated Cases:
Not available at this time
