Non-invasive Sensing of Free Metal Ions Using iCEST

Case ID:
C12425
Disclosure Date:
3/28/2013

C12425: MRI-based Non-Invasive Metal Ion Detection System

Novelty: Novel method combining chemical exchange saturation transfer (CEST) magnetic resonance imaging (MRI) with 19F fluorinated chelators to detect free metal ions with high sensitivity and specificity.

Value Proposition: Although metal ions are involved in a myriad of biological processes, non-invasive detection of free metal ions in deep tissue remains a formidable challenge. This invention presents an approach for specific sensing of the presence of metal ions in which the amplification strategy of CEST is combined with the broad range of chemical shifts found in 19F NMR spectroscopy to obtain magnetic resonance images of the metal ions. Additional advantages include:
• Produces images without background signal
• Non-invasive
• Highly sensitive to the details of local environment
• 19F has a 20 times larger range compared to water-based CEST imaging
• High specificity allows detection of ions in the presence of competing ions

Technical Details: Johns Hopkins researchers have developed a new imaging technique called ion CEST (iCEST) to detect free metal ions in vivo. The system combines the sensitivity and large range of chemical shifts observed in 19F NMR spectra with the MRI signal amplification technique. In order to detect a specific metal ion and determine the concentration, a 19F fluorinated chelator binds the specific metal ion causing a chemical shift change, which is detected by radiofrequency labeling at chelator-metal ion complex frequency, paired with the detection of label transfer to the free 19F chelator frequency. By analyzing the exchange of free 19F chelate and the 19F chelator-metal ion complex, the ion concentration (as low as nM range) can be indirectly determined.

Looking for Partners: To develop & commercialize the technology as an in vivo metal ion sensor for biological research and clinical diagnosis.

Patent Status: Pending US Application US-2016-0091443

Data Availability: Under CDA / NDA

Publications/Associated Cases: J Am Chem Soc. 2013 Aug 21;135(33):12164-7

Patent Information:
Title App Type Country Serial No. Patent No. File Date Issued Date Expire Date Patent Status
NON-INVASIVE SENSING OF FREE METAL IONS USING ION CHEMICAL EXCHANGE SATURATION TRANSFER PCT: Patent Cooperation Treaty United States 14/785,486 10,753,892 10/19/2015 8/25/2020 1/19/2036 Granted
Inventors:
Category(s):
Get custom alerts for techs in these categories/from these inventors:
For Information, Contact:
Heather Curran
hpretty2@jhu.edu
410-614-0300
Save This Technology:
2017 - 2022 © Johns Hopkins Technology Ventures. All Rights Reserved. Powered by Inteum